To view this content, you need to install or upgrade your Flash Player.

Bypass the Flash Player detection.

Search the Competence Database

Updated Competence Database

The Competence database is based on the member's competence profiles in geometric and dimensional metrology. Each profile consists of several services which have been defined according to different dimensional metrology items (instruments, standards and artefacts, tools and methods, specific objects as well as supporting tasks).

The current database figures are:

  • 45 active members
  • 476 member records
  • 2776 services defined
  • 3045 available parameters
  • 1277 specified parameters
thread measurement in progress

Online Calculation

EVIGeM offers the possibility of calculating the pitch, diameter or indicated value for thread measurements according to the guideline EA-10/10 online on this website.


Take me to the online calculation

 

View EVIGeM-Flash spot no 2
(DSL connection recommended)

Random Product from our Product Database:

View product description

Talysurf CCI 6000

Talysurf CCI 6000

  • 3D surface profiling with high accuracy
  • Coherence Correlation Interferometer is
  • non-contact and non-destructive
  • suitable for profile peaks between 1nm and 100um in height
  • 0.01nm resolution
  • high speed data aquisition and analysis
Talysurf CCI 6000 is the most accurate optical 3D surface...


View product description
The EVIGeM members

Join the network

Additional organisations are invited to apply for a membership in the EVIGeM Virtual Institute. If you are interested in joining this network in the field of geometric and dimensional metrology, contact us and inquire about membership. Applications from companies and institutes offering technical expertise in any of EVIGeM’s dimensional subject areas and supporting tasks are always welcome.

Internetportal MMM ETH Zürich, Switzerland:

Measurement Science and Technology

Various glossary term:

Focus, focal point

The focus (focal point) of an optical system is the location, where two parallel incident rays come to intersection.